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The base current and related 1/f noise for SiGe HBTs realized by SEG/NSEG technology on SOI and bulk substrates

Lukyanchikova, N. et al.

Materials science in semiconductor processing.; Germanium based semiconductors from materials to devices; Nice, France, 2006; May, 2006, 727-731 -- Elsevier; 2006 (pages 727-731) -- 2006

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Surface Preparation Techniques for the Atomic Layer Deposition of Hafnium Oxide

Conard, T. et al.

Materials Research Society symposia proceedings.; Gate stack scaling: materials, role of interfaces and reliability implications; San Francisco, Calif., 2006; Apr, 2006, 143-148 -- Materials Research Society; 2006 Part: Part; (pages 143-148) -- 2006

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Photoluminescence, Capacitance-Voltage, and Variable Field Hall Effect Measurements of Mg-Doped InN

Carder, D. et al.

Materials Research Society symposia proceedings.; Material Research Society; Boston, Mass, 2006, 2006, I65 -- Warrendale, Penn; Materials Research Society; 2006 -- 2006

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Current Status of SiC Power Switching Devices: Diodes and GTOs

Seshadri, S. et al.

Materials Research Society symposia proceedings.; Wide-bandgap semiconductors for high-power, high-frequency and high temperature applications; San Francisco; CA, 1999; Apr, 1999, 23-32 -- Warrendale, PA; Materials Research Society; 1999 (pages 23-32) -- 1999

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Experimental and Theoretical Analysis of the Hall-Mobility in n-Type Bulk 6H- and 4H-SiC

Mueller, S. G. et al.

Materials Research Society symposia proceedings.; Wide-bandgap semiconductors for high-power, high-frequency and high temperature applications; San Francisco; CA, 1999; Apr, 1999, 275-280 -- Warrendale, PA; Materials Research Society; 1999 (pages 275-280) -- 1999

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Mobility Characterization of p-Type and n-Type Strained Si~1~-~x~-~yGe~xC~y/Si Epilayer Hall Devices

Peterson, J. J. et al.

Materials Research Society symposia proceedings.; III-V and IV-IV materials and processing challenges for highly integrated microelectronics and optoelectronics; Boston; MA, 1998; Nov, 1999, 293-298 -- Warrendale, PA; Materials Research Society; 1999 (pages 293-298) -- 1999

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Interface Characterization and Delamination Mechanism of c-BN Film

Kim, L.-H. et al.

Materials Research Society symposia proceedings.; Interfacial engineering for optimized properties; Boston; MA, 1996; Dec, 1997, 443-448 -- MRS; 1997 Part: Part; (pages 443-448) -- 1997

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Interfaces and Fatigue Damage in Ti-15-3/SCS-6(0/90)~2~s Composite

Soboyejo, W. O. et al.

Materials Research Society symposia proceedings.; Interfacial engineering for optimized properties; Boston; MA, 1996; Dec, 1997, 261-266 -- MRS; 1997 Part: Part; (pages 261-266) -- 1997

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Boron Nitride Coatings on Silicon Carbide Whiskers

Brown, S. et al.

Materials Research Society symposia proceedings.; Interfacial engineering for optimized properties; Boston; MA, 1996; Dec, 1997, 421-428 -- MRS; 1997 Part: Part; (pages 421-428) -- 1997

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Compositional Effects on Grain Boundary Dislocation Stability in Pure Aluminum and Aluminum Alloys

Song, S. G. et al.

Materials Research Society symposia proceedings.; Interfacial engineering for optimized properties; Boston; MA, 1996; Dec, 1997, 237-242 -- MRS; 1997 Part: Part; (pages 237-242) -- 1997

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