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Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
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1 |
Material Type: Article
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In situ characterization of crystal growth and heat treatment in semiconductor materials [6706-07]Akers, D.W. et al.Proceedings of SPIE, the International Society for Optical Engineering. VOL 6706, ; 2007, 6706 08 -- International Society for Optical Engineering; 1999 -- 2007Check library holdings |
2 |
Material Type: Article
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Material dependence of bulk leakage current in CdZnTe detectors (Invited Paper) [6706-20]Amman, M. et al.Proceedings of SPIE, the International Society for Optical Engineering. VOL 6706, ; 2007, 6706 0L -- International Society for Optical Engineering; 1999 -- 2007Check library holdings |
3 |
Material Type: Article
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Charge transport mechanism in CdTe-based p-n junction detectors formed by laser irradiation [7805-16]Aoki, T. et al.Proceedings of SPIE, the International Society for Optical Engineering. VOL 7805, ; 2010, 7805 17 -- International Society for Optical Engineering; 1999 -- 2010Check library holdings |
4 |
Material Type: Article
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Reasons of low charge collection efficiency in CdTe-based x/y detectors with ohmic contacts [8852-49]Aoki, T. et al.Proceedings of SPIE, the International Society for Optical Engineering. VOL 8852, ; 2013, 8852 1C -- International Society for Optical Engineering; 1999 Part; -- 2013Check library holdings |
5 |
Material Type: Article
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CdTe x-ray image sensor driven by field emitter array (Invited Paper) [7079-38]Aoki, T. et al.Proceedings of SPIE, the International Society for Optical Engineering. VOL 7079, ; 2008, 7079 12 -- International Society for Optical Engineering; 1999 -- 2008Check library holdings |
6 |
Material Type: Article
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A systematic study of mercuric iodide platelet growth in horizontal furnaces [7079-21]Ariesanti, E. et al.Proceedings of SPIE, the International Society for Optical Engineering. VOL 7079, ; 2008, 7079 0L -- International Society for Optical Engineering; 1999 -- 2008Check library holdings |
7 |
Material Type: Article
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Effect of Te inclusions on internal electric field of CdMnTe gamma-ray detector [7449-45]Babalola, O.S. et al.Proceedings of SPIE, the International Society for Optical Engineering. VOL 7449, ; 2009, 7449 1A -- International Society for Optical Engineering; 1999 -- 2009Check library holdings |
8 |
Material Type: Article
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Effect of Te inclusions on internal electric field of CdMnTe gamma-ray detector [7449-45]Babalola, O.S. et al.Proceedings of SPIE, the International Society for Optical Engineering.; Hard x-ray, gamma ray and neutron detector physics; San Diego, CA, 2009; Aug, 2009, 7449 1A -- Bellingham, Wash.; SPIE; c2009 -- 2009Check library holdings |
9 |
Material Type: Article
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E-beam electron mobility study on CZT and CsI [8142-51]Baker, S. et al.Proceedings of SPIE, the International Society for Optical Engineering. VOL 8142, ; 2011, 8142 1G -- International Society for Optical Engineering; 1999 Part: Part; -- 2011Check library holdings |
10 |
Material Type: Article
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E-beam electron mobility study on CZT and CsI [8142-51]Baker, S. et al.Proceedings of SPIE, the International Society for Optical Engineering.; Hard X-ray, Gamma-ray, and Neutron Detector Physics; San Diego, CA, 2011; Aug, 2011, 8142 1G -- Bellingham; SPIE; 2011 Part: Part; -- 2011Check library holdings |