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Relational discriminant analysis

Duin, R.P.W.; Pekalska, E.; Ridder, D.d.

Pattern recognition letters. VOL 20; NUMBER 11-13, ; 1999, 1175-1181 -- ELSEVIER (pages 1175-1181) -- 1999

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10
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The Dipping Phenomenon

Loog, M.; Duin, R.P.W.

Journal on data semantics.; Simulation, modeling, and programming for autonomous robots; SIMPAR 2012; Tsukuba, Japan, 2012; Nov, 2012, 310-317 -- Heidelberg; Springer; c2012 Part 7628; (pages 310-317) -- 2012

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11
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Non-Euclidean Dissimilarities: Causes and Informativeness

Duin, R.P.W.; Pekalska, E.

Journal on data semantics.; Structural, syntactic, and statistical pattern recognition; Cesme, Turkey, 2010; Aug, 2010, 324-333 -- Berlin; Springer; c2010 (pages 324-333) -- 2010

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12
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Linear Model Combining by Optimizing the Area under the ROC Curve

Tax, D.M.J.; Duin, R.P.W.; Arzhaeva, Y.

INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION.; International Conference on Pattern Recognition; Hong Kong, China, 2006; Apr, 2006, 119-122 -- Piscataway; IEEE; 2006 Part: 1; (pages 119-122) -- 2006

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13
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A Trainable Similarity Measure for Image Classification

Paclik, P.; Novovicova, J.; Duin, R.P.W.

Part: 3; (pages 391-394) -- 2006

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14
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A Study on Combining Sets of Differently Measured Dissimilarities

Ibba, A.; Duin, R.P.W.; Lee, W.-J.

Part: 5; (pages 3360-3363) -- 2010

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15
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A Trainable Similarity Measure for Image Classification

Paclik, P.; Novovicova, J.; Duin, R.P.W.

INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION.; International Conference on Pattern Recognition; Hong Kong, China, 2006; Apr, 2006, 391-394 -- Piscataway; IEEE; 2006 Part: 1; (pages 391-394) -- 2006

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16
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Precision-Recall Operating Characteristic (P-ROC) Curves in Imprecise Environments

Landgrebe, T.C.W.; Paclic, P.; Duin, R.P.W.

INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION.; International Conference on Pattern Recognition; Hong Kong, China, 2006; Apr, 2006, 123-127 -- Piscataway; IEEE; 2006 Part: 1; (pages 123-127) -- 2006

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17
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Linear Model Combining by Optimizing the Area under the ROC Curve

Tax, D.M.J.; Duin, R.P.W.; Arzhaeva, Y.

Part: 4; (pages 119-122) -- 2006

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18
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Maximizing the area under the ROC curve by pairwise feature combination

Marrocco, C.; Duin, R.P.W.; Tortorella, F.

Pattern recognition. VOL 41; NUMB 6, ; 2008, 1961-1974 -- Elsevier Science B.V., Amsterdam. (pages 1961-1974) -- 2008

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by this Author/Contributor:

  1. Duin, R.P.W.
  2. Loog, M.
  3. Tax, D.M.J.
  4. Orozco-Alzate, M.
  5. Pekalska, E.

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