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Electron microscopy analysis of the microstructure of Ti~1~-~xAl~xN alloy thin films prepared using a chemical vapour deposition method

Ikeda, S.; Gilles, S.; Chenevier, B.

Thin solid films. VOL 315; ISSUE 1-2, ; 1998, 258-263 -- ELSEVIER SEQUOIA SA (pages 258-263) -- 1998

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Electrical properties evolution under reducing gaseous mixtures (H"2, H"2S, CO) of SnO"2 thin films doped with Pd/Pt aggregates and used as polluting gas sensors

Gaidi, M.; Chenevier, B.; Labeau, M.

Sensors and actuators. B, Chemical. VOL 62; NUMBER 1, ; 2000, 43-48 -- ELSEVIER SEQUOIA S A (pages 43-48) -- 2000

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Preface

Torres, J.; Madar, R.; Chenevier, B.

Microelectronic engineering. VOL 83; NUMBER 11-12, ; 2006, 2033-2035 -- Elsevier Science B.V., Amsterdam. (pages 2033-2035) -- 2006

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Preface

Chenevier, B.; Farcy, A.; Maitrejean, S.

Microelectronic engineering. VOL 87; NUMBER 3, ; 2010, 243-244 -- Elsevier Science B.V., Amsterdam. (pages 243-244) -- 2010

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Stresses arising from a solid state reaction between palladium films and Si(001) investigated by in situ combined x-ray diffraction and curvature measurements

Gergaud, P. Thomas, O. Chenevier, B.

Journal of applied physics. VOL 94; PART 3, ; 2003, 1584-1591 -- AMERICAN INSTITUTE OF PHYSICS (pages 1584-1591) -- 2003

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The coexistence of two phases with ordered and disordered vacancies in PrGe~1~.~6

Lambert-Andron, B. et al.

Journal of physics. Condensed matter. VOL 6; NUMBER 42, ; 1994, 8725 -- IOP PUBLISHING LTD Part: Part 42; -- 1994

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Challenges in advanced metallization schemes

Brillouet, M. et al.

Microelectronic engineering.; Materials for advanced metallization; MAM 2006; Brussels, 2004; Mar, 2006, 2036-2041 -- Elsevier; 2006 (pages 2036-2041) -- 2006

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X-ray diffraction analysis of YBCO thin films synthesized by aerosol MOCVD

Chenevier, B. et al.

Physica. C, Superconductivity.; Materials and mechanisms of superconductivity: high temperature superconductors; Grenoble; France, 1994; Jul, 1994, 657-658 -- North-Holland; 1994 Part: Part 1; (pages 657-658) -- 1994

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Anisotropy of thermal expansion in YAlO~3 and NdGaO~3 (3 pages)

Chaix-Pluchery, O.; Chenevier, B.; Robles, J. J.

Applied physics letters. VOL 86; NUMB 25, ; 2005, 251911 -- AMERICAN INSTITUTE OF PHYSICS -- 2005

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In situ simultaneous XAS and electrical characterizations of Pt-doped tin oxide thin film deposited by pyrosol method for gas sensors application

Gaidi, M. et al.

Sensors and actuators. B, Chemical. VOL 120; NUMBER 1, ; 2006, 313-315 -- Elsevier Science B.V., Amsterdam. (pages 313-315) -- 2006

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  1. Chenevier, B.
  2. Madar, R
  3. Torres, J
  4. Matko, I.
  5. Chenevier-Gobeaux, C.

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