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DxTools: Processing large data files recorded with the Bruker D8 diffractometer

Journal of Applied Crystallography, June 2017, Vol.50(3), pp.967-974 [Peer Reviewed Journal]

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Statistical nature of atomic disorder in irradiated crystals

Physical Review Letters, 2016, Vol.116(245501), pp.1-5 [Peer Reviewed Journal]

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Statistical nature of atomic disorder in irradiated crystals

Physical Review Letters, June 2016, Vol.116(24) [Peer Reviewed Journal]

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Combined strain and composition-induced effects in the metal-insulator transition of epitaxial VO 2 films

Applied Physics Letters, 18 December 2017, Vol.111(25), p.251902 [Peer Reviewed Journal]

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Polytypic transformations in SiC: Diffuse x-ray scattering and Monte Carlo simulations

Physical Review B : Condensed matter and materials physics, 2013, Vol.88, pp.024103-1-024103-10 [Peer Reviewed Journal]

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Strain and stress build-up in He-implanted UO 2 single crystals: an X-ray diffraction study

Journal of Materials Science, 2011, Vol.46(13), pp.4683-4689 [Peer Reviewed Journal]

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Structural observation of piezoelectric inhomogeneity in a mixed-orientation Na0.5Bi0.5TiO3 perovskite thin film

Applied Physics Letters, 2014, Vol.105(24), p.242901 [Peer Reviewed Journal]

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Depth-dependent phase change in Gd2O3 epitaxial layers under ion irradiation

Applied Physics Letters, 2015, Vol.107(13), p.131903 [Peer Reviewed Journal]

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Strain profiles in ion implanted ceramic polycrystals: a new approach based on reciprocal-space crystal selection

Applied Physics Letters, 18 January 2016, Vol.108(3), p.031903 [Peer Reviewed Journal]

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Interplay between atomic disorder, lattice swelling and defect energy in ion-irradiation-induced amorphization of SiC

Physical Review. B, Condensed Matter and Materials Physics, 25 November 2014, Vol.90(17) [Peer Reviewed Journal]

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by this Author/Contributor:

  1. Boulle, Alexandre
  2. Boulle, A
  3. Guinebretière, René
  4. Debelle, A.
  5. Conchon, Florine

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