skip to main content
Show Results with:

4 results  for Everything in this catalogue

Result Number Material Type Add to My Shelf Action Record Details and Options
1
Material Type:
Article
Add to My workspace

11.4 Nanoelectromechanical DRAM for Ultra-Large-Scale Integration (ULSI)

Jang, J. E. et al.

Technical digest / International Electron Devices Meeting.; IEEE international electron devices meeting; Washington, DC, 2005; Dec, 0, 269-272 -- Institute of Electrical and Electronics Engineers; 2005 (pages 269-272)

Check library holdings

2
Material Type:
Article
Add to My workspace

35.5 Novel Transition Layer Engineered Si Nanocrystal Flash Memory with MHSOS Structure Featuring Large V~t~h Window and Fast P/E Speed

Joo, K.-H. et al.

Technical digest / International Electron Devices Meeting.; IEEE international electron devices meeting; Washington, DC, 2005; Dec, 0, 885-888 -- Institute of Electrical and Electronics Engineers; 2005 (pages 885-888)

Check library holdings

3
Material Type:
Article
Add to My workspace

12.5 A Novel Methodology on Tuning Work Function of Metal Gate Using Stacking Bi-Metal Layers

Jeon, I. S. et al.

Technical digest / International Electron Devices Meeting.; Electron devices; International electron devices meeting 2004; San Francisco, CA, 2004; Dec, 0, 303-306 -- IEEE; 2004 Part: Part; (pages 303-306)

Check library holdings

4
Material Type:
Article
Add to My workspace

Metal-Ferroelectric-Semiconductor Field-Effect Transistor (MFSFET) for Single Transistor Memory Using Poly-Si source/Drain and BaMgF~4 Dielectric

Lyu, J. S. et al.

Technical digest / International Electron Devices Meeting.; Electron devices; San Francisco; CA, 1996; Dec, 1996, 503-506 -- IEEE; 1996 Part: Part; (pages 503-506) -- 1996

Check library holdings

4 results  for Everything in this catalogue

Refine Search Results

Try a new search

Ignore my search and look for everything

by this Author/Contributor:

  1. Yoo, I.-K.
  2. Choi, Y
  3. Jeon, I. S.
  4. Jang, J. E.
  5. Zhao, P.

on this subject:

  1. IEEE
  2. IEDM

Searching Remote Databases, Please Wait