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A Gate-All-Around Tunneling Field-Effect Transistor with SiO2 Core and Si Shell Structure
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A Gate-All-Around Tunneling Field-Effect Transistor with SiO2 Core and Si Shell Structure

Journal Of Computational And Theoretical Nanoscience, 2014 Aug, Vol.11(8), pp.1826-1832 [Peer Reviewed Journal]

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2
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A Quantum-Mechanical View on the Capacitance of a Silicon p-n Junction

IEEE Electron Device Letters, April 2007, Vol.28(4), pp.312-314 [Peer Reviewed Journal]

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3
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Article
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Comparing of the scaling property of carbon nanotube field effect transistors

Guofang Keji Daxue Xuebao/Journal of National University of Defense Technology, June 2011, Vol.33(3), pp.77-82

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4
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Counterdoped Pocket Thickness Optimization of Gate-on-Source-Only Tunnel FETs

IEEE Transactions on Electron Devices, January 2013, Vol.60(1), pp.6-12 [Peer Reviewed Journal]

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5
Direct and Indirect Band-to-Band Tunneling in Germanium-Based TFETs
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Article
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Direct and Indirect Band-to-Band Tunneling in Germanium-Based TFETs

Ieee Transactions On Electron Devices, 2012 Feb, Vol.59(2), pp.292-301 [Peer Reviewed Journal]

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6
Double-island single-electron devices - A useful unit device for single-electron logic LSI's
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Double-island single-electron devices - A useful unit device for single-electron logic LSI's

Ieee Transactions On Electron Devices, 1999 May, Vol.46(5), pp.954-959 [Peer Reviewed Journal]

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7
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Article
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Electric field dependent structural and vibrational properties of the Si(100)-H(2×1) surface and its implications for STM induced hydrogen desorption

Surface Science, 1999, Vol.429(1), pp.327-337 [Peer Reviewed Journal]

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8
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Article
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Energy band diagrams of nano-size field-effect transistors

Surface Science, 1996, Vol.361, pp.500-504 [Peer Reviewed Journal]

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9
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Engineering the Electron-Hole Bilayer Tunneling Field-Effect Transistor

IEEE Transactions on Electron Devices, May 2014, Vol.61(5), pp.1599-1606 [Peer Reviewed Journal]

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10
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Conference Proceeding
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Enhancing analog performance and suppression of subthreshold swing using hetero-junctionless double gate tunnel FETs

Proceeding - IEEE International Conference on Computing, Communication and Automation, ICCCA 2017, 19 December 2017, Vol.2017-, pp.1449-1452

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