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Non-Euclidean Dissimilarities: Causes and Informativeness

Duin, R.P.W.; Pekalska, E.

Journal on data semantics.; Structural, syntactic, and statistical pattern recognition; Cesme, Turkey, 2010; Aug, 2010, 324-333 -- Berlin; Springer; c2010 (pages 324-333) -- 2010

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The Dipping Phenomenon

Loog, M.; Duin, R.P.W.

Journal on data semantics.; Structural, syntactic and statistical pattern recognition; Structural, SSPR & SPR; Tsukuba, Japan, 2012; Nov, 2012, 310-317 -- Heidelberg; Springer; c2012 Part 7626; (pages 310-317) -- 2012

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Learning Curves for the Analysis of Multiple Instance Classifiers

Tax, D.M.J.; Duin, R.P.W.

Journal on data semantics.; International workshop on structural and syntactic pattern recognition; Structural, syntactic, and statistical pattern recognition: joint IAPR international workshop, SSPR & SPR 2008; Orlando, FL, 2008; Dec, 2008, 724-733 -- Berlin; Springer; c2008 (pages 724-733) -- 2008

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An Inexact Graph Comparison Approach in Joint Eigenspace

Lee, W.-J.; Duin, R.P.W.

Journal on data semantics.; International workshop on structural and syntactic pattern recognition; Structural, syntactic, and statistical pattern recognition: joint IAPR international workshop, SSPR & SPR 2008; Orlando, FL, 2008; Dec, 2008, 35-44 -- Berlin; Springer; c2008 (pages 35-44) -- 2008

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An Empirical Comparison of Kernel-Based and Dissimilarity-Based Feature Spaces

Kim, S.-W.; Duin, R.P.W.

Journal on data semantics.; Structural, syntactic, and statistical pattern recognition; Cesme, Turkey, 2010; Aug, 2010, 559-568 -- Berlin; Springer; c2010 (pages 559-568) -- 2010

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Dissimilarity-Based Classifications in Eigenspaces

Kim, S.-W. et al.

Journal on data semantics.; Pattern recognition; Progress in pattern recognition, image analysis, computer vision and applications; Pucon, Chile, 2011; Nov, 2011, 425-432 -- Heidelberg; Springer; c2011 Part: Part 7042; (pages 425-432) -- 2011

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The Dissimilarity Representation for Structural Pattern Recognition

Duin, R.P.W. et al.

Journal on data semantics.; Pattern recognition; Progress in pattern recognition, image analysis, computer vision and applications; Pucon, Chile, 2011; Nov, 2011, 1-24 -- Heidelberg; Springer; c2011 Part: Part 7042; (pages 1-24) -- 2011

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Feature-Based Dissimilarity Space Classification

Duin, R.P.W.|Loog, M.|Pekalska, E.|Tax, D.M.J.

Berlin; Springer; c2010 (pages 46-55) -- 2010

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Metric Learning in Dissimilarity Space for Improved Nearest Neighbor Performance

Duin, R.P.W. et al.

Journal on data semantics.; Statistical techniques in pattern recognition; Structural, syntactic, and statistical pattern recognition: joint IAPR international workshop, S+SSPR 2014; Joensuu, Finland, 2014; Aug, 2014, 183-192 -- Heidelberg; Springer; [2014] Part 8621; (pages 183-192) -- 2014

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On Using Asymmetry Information for Classification in Extended Dissimilarity Spaces

Plasencia-Calana, Y. et al.

Journal on data semantics.; Iberoamerican Congress on Pattern Recognition; Buenos Aires, Argentina, 2012; Sep, 2012, 503-510 -- Heidelberg; Springer; c2012 Part 7441; (pages 503-510) -- 2012

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by this Author/Contributor:

  1. Duin, R.P.W.
  2. Orozco-Alzate, M.
  3. Loog, M.
  4. Pekalska, E.
  5. Tax, D.M.J.

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