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Atom-Probe Tomographic Analyses of Hydrogen Interstitial Atoms in Ultrahigh Purity Niobium

Kim, Yoon-Jun; Seidman, David N.

Microscopy and microanalysis. Volume 21:Number 3 (2015); pp 535-543 -- Cambridge University Press

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Quantitative Annular Dark Field Electron Microscopy Using Single Electron Signals

Ishikawa, Ryo et al.

Microscopy and microanalysis. Volume 20:Number 1 (2014, February); pp 99-110 -- Cambridge University Press

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