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Church, Filadelfia, Costa Rica

Cha, J.

EMAP ARCHITECTURE (pages 83-88) -- 2003

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the design workshop aimed at revitalizing Place d'Armes, a critical public space in Montreal's urban fabric

Cha, J.

Canadian architect. VOL 53; NUMB 2, ; 2008, 31-35 -- THE SOUTHAM MAGAZINE GROUP (pages 31-35) -- 2008

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A Computationally Efficient Fano-Based Sequential Detection Algorithm for V-BLAST Systems

Cha, J.; Kang, J.

IEICE transactions on communications. VOL 90; NUMB 6, ; 2007, 1528-1531 -- INSTITUTE OF ELECTRONICS, INFORMATION & (pages 1528-1531) -- 2007

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Efficient V-BLAST Detection Using Modified Fano Algorithm

Cha, J.; Kang, J.

IEICE transactions on communications. VOL 89; NUMB 6, ; 2006, 1955-1959 -- INSTITUTE OF ELECTRONICS, INFORMATION & (pages 1955-1959) -- 2006

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Topological crystalline insulator nanostructures

Shen, J.; Cha, J.

Nanoscale. VOL 6; NUMBER 23, ; 2014, 14133-14140 -- Royal Society of Chemistry Part 23; (pages 14133-14140) -- 2014

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Class of ternary spreading sequences with zero correlation duration

Cha, J. S.

Electronics letters. VOL 37; PART 10, ; 2001, 636 -- IEE -- 2001

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Data Randomization Scheme for Endurance Enhancement and Interference Mitigation of Multilevel Flash Memory Devices

Cha, J.; Kang, S.

ETRI journal. VOL 35; NUMB 1, ; 2013, 166-169 -- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH Part 1; (pages 166-169) -- 2013

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Optimal Replacement of Heterogeneous Items With Minimal Repairs

Cha, J. H.

IEEE transactions on reliability. VOL 65; NUMBER 2, ; 2016, 593-603 -- IEEE INSTITUTE OF ELECTRICAL AND ELECTRONICS (pages 593-603) -- 2016

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A study of the increasing methods of user number in approximately synchronized CDMA system

Cha, J.-S.

To¯hoku Daigaku Dentsu¯ Danwakai kiroku. VOL 70; PART 1, ; 2001, 54-57 -- TOHOKU DAIGAKU DENTSU DANWAKAI (pages 54-57) -- 2001

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On Optimal Burn-In Procedures-A Generalized Model

Cha, J. H.

IEEE transactions on reliability. VOL 54; NUMB 2, ; 2005, 198-206 -- IEEE INSTITUTE OF ELECTRICAL AND ELECTRONICS (pages 198-206) -- 2005

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Results 1 - 10 of 1,193  for Everything in this catalogue

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