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Micropropulsion for small spacecraft: a new challenge for field effect electric propulsion and microstructured liquid metal ion sources

Mitterauer, J. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 380-386 -- John Wiley,; 2004 (pages 380-386) -- 2004

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Comments and references relating to early work in field electron emission

Kleint, C. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 387-390 -- John Wiley,; 2004 (pages 387-390) -- 2004

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Proceedings of the 48th International field emission symposium / editors, F. Danoix, R. G. Forbes, J. F. Watts.

John Wiley, 2004.

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Field penetration and field electron emission from HTSC materials

Uimanov, I. V. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 407-410 -- John Wiley,; 2004 (pages 407-410) -- 2004

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Proposed XML-based three-dimensional atom probe data standard

Miller, M. K. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 601-605 -- John Wiley,; 2004 (pages 601-605) -- 2004

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APFIM investigations on the intermetallic Ni~4~9~.~5Al~4~9~.~5Re1 alloy

Deges, J. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 533-539 -- John Wiley,; 2004 (pages 533-539) -- 2004

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Field emission current fluctuations from isolated carbon nanotubes

Tuggle, D. W. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 489-492 -- John Wiley,; 2004 (pages 489-492) -- 2004

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Time-of-flight atom-probe field ion microscope studies of surface-related phenomena

Tsong, T. T. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 365-371 -- John Wiley,; 2004 (pages 365-371) -- 2004

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Physics and chemistry in high electric fields

Kreuzer, H. J. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 372-379 -- John Wiley,; 2004 (pages 372-379) -- 2004

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Preciptation of niobium carbides in Fe-C-Nb steel

Bemont, E. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 585-588 -- John Wiley,; 2004 (pages 585-588) -- 2004

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Results 1 - 10 of 30  for Everything in this catalogue

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by this Author/Contributor:

  1. Danoix, F.
  2. Watts, J. F.
  3. Forbes, R. G.
  4. Deng, S. Z.
  5. Chen, J

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