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Classification Consistency and Accuracy for Mixed-Format Tests

Kim, Stella Y.; Lee, Won-Chan

Applied measurement in education. Volume 32:Issue 2 (2019, June); pp 97-115 -- Routledge, Taylor & Francis Group

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Classification Consistency and Accuracy for Mixed-Format Tests

Kim, Stella Y.; Lee, Won-Chan

Applied measurement in education. Volume 32:Number 2 (2019, April 3rd); pp 97-115 -- Routledge, Taylor & Francis Group

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