skip to main content
Show Results with:
Refined by: material type: Conference Proceedings remove journal title: AIP Conference Proceedings remove subject: Crystal Defects remove
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Material Type:
Conference Proceeding
Add to My workspace

Study of the stability of 3C-SiC single crystals using high-resolution diffuse X-ray scattering

AIP Conference Proceedings, 2010, Vol.1292, pp.71-74 [Peer Reviewed Journal]

No full-text

View all versions
2
Material Type:
Conference Proceeding
Add to My workspace

Defects and Polytypism in SiC: The Role of Diffuse X-Ray Scattering

AIP Conference Proceedings, Vol.1292, pp.43-46 [Peer Reviewed Journal]

No full-text

View all versions
3
Material Type:
Conference Proceeding
Add to My workspace

Impact of nonintentional Al impurity to carrier lifetime and diffusion in sublimation grown 3C heterostructures

AIP Conference Proceedings, 2010, Vol.1292, pp.107-110 [Peer Reviewed Journal]

No full-text

4
Material Type:
Conference Proceeding
Add to My workspace

Growth optimization of columnar nanostructured diamond films with high electrical performances for SOD applications

AIP Conference Proceedings, 2010, Vol.1292, pp.129-132 [Peer Reviewed Journal]

No full-text

5
Material Type:
Conference Proceeding
Add to My workspace

Vapor phase vs. liquid phase: What is the best choice for the growth of bulk 3C-SiC crystals?

AIP Conference Proceedings, 2010, Vol.1292, pp.1-6 [Peer Reviewed Journal]

No full-text

6
Material Type:
Conference Proceeding
Add to My workspace

Optical characterization of bulk mobility in 3C-SiC films grown on different orientation of Si substrates.

AIP Conference Proceedings, 2010, Vol.1292, pp.99-102 [Peer Reviewed Journal]

No full-text

Searching Remote Databases, Please Wait