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On Improving Dissimilarity-Based Classifications Using a Statistical Similarity Measure

Kim, S.-W.; Duin, R.P.W.

Journal on data semantics.; Progress in pattern recognition, image analysis, computer vision, and applications: 15th IberoAmerican Congress on Pattern Recognition, CIARP 2010, Sao Paulo, Brazil, November 8-11, 2010 : proceedings /; Sao Paulo, Brazil, 2010; Nov, 2010, 418-425 -- Berlin; Springer; c2010 (pages 418-425) -- 2010

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Dissimilarity-Based Classifications in Eigenspaces

Kim, S.-W. et al.

Journal on data semantics.; Pattern recognition; Progress in pattern recognition, image analysis, computer vision and applications; Pucon, Chile, 2011; Nov, 2011, 425-432 -- Heidelberg; Springer; c2011 Part: Part 7042; (pages 425-432) -- 2011

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The Dissimilarity Representation for Structural Pattern Recognition

Duin, R.P.W. et al.

Journal on data semantics.; Pattern recognition; Progress in pattern recognition, image analysis, computer vision and applications; Pucon, Chile, 2011; Nov, 2011, 1-24 -- Heidelberg; Springer; c2011 Part: Part 7042; (pages 1-24) -- 2011

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Missing Values in Dissimilarity-Based Classification of Multi-way Data

Porro-Munoz, D.; Duin, R.P.W.; Talavera, I.

Journal on data semantics.; Iberoamerican congress on pattern recognition; image analysis, computer vision, and applications: CIARP 2013; Havana, 2013; Nov, 2013, 214-221 -- Heidelberg; Springer; [2013] Part 8258; (pages 214-221) -- 2013

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Towards Cluster-Based Prototype Sets for Classification in the Dissimilarity Space

Plasencia-Calana, Y. et al.

Journal on data semantics.; Iberoamerican congress on pattern recognition; image analysis, computer vision, and applications: CIARP 2013; Havana, 2013; Nov, 2013, 294-301 -- Heidelberg; Springer; [2013] Part 8258; (pages 294-301) -- 2013

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by this Author/Contributor:

  1. Duin, R.P.W.
  2. Kim, S.‐W.
  3. San Martin, C.
  4. Porro-Munoz, D.
  5. Talavera, I.

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