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On Refining Dissimilarity Matrices for an Improved NN Learning

Duin, R.P.W.; Pekalska, E.

INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION.; International conference on patttern recognition (ICPR 2008); Tampa, FL, 2008; Dec, 2008, 604-607 -- New York; IEEE Press Books; 2008 Part: 1; (pages 604-607) -- 2008

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On Refining Dissimilarity Matrices for an Improved NN Learning

Duin, R.P.W.; Pekalska, E.

Part: 1; (pages 604-607) -- 2008

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A simplified volume under the ROC hypersurface

Landgrebe, T.C.W.; Duin, R.P.W.

Africa research journal : Research journal of the South African Institute of Electrical Engineers / SAIEE. VOL 98; NUMB 3, ; 2007, 94-100 -- SAIEE Publications (Pty) Ltd Part 3; (pages 94-100) -- 2007

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Statistical Analysis of Gait Data to Assist Clinical Decision Making

Koktas, N.S.; Duin, R.P.W.

Journal on data semantics.; Medical content-based retrieval for clinical decision support; London, 2009; Sep, 2010, 61-68 -- Berlin; Springer; c2010 (pages 61-68) -- 2010

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Non-Euclidean Dissimilarities: Causes and Informativeness

Duin, R.P.W.; Pekalska, E.

Journal on data semantics.; Structural, syntactic, and statistical pattern recognition; Cesme, Turkey, 2010; Aug, 2010, 324-333 -- Berlin; Springer; c2010 (pages 324-333) -- 2010

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A Trainable Similarity Measure for Image Classification

Paclik, P.; Novovicova, J.; Duin, R.P.W.

INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION.; International Conference on Pattern Recognition; Hong Kong, China, 2006; Apr, 2006, 391-394 -- Piscataway; IEEE; 2006 Part: 1; (pages 391-394) -- 2006

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Maximizing the area under the ROC curve by pairwise feature combination

Marrocco, C.; Duin, R.P.W.; Tortorella, F.

Pattern recognition. VOL 41; NUMB 6, ; 2008, 1961-1974 -- Elsevier Science B.V., Amsterdam. (pages 1961-1974) -- 2008

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Precision-Recall Operating Characteristic (P-ROC) Curves in Imprecise Environments

Landgrebe, T.C.W.; Paclic, P.; Duin, R.P.W.

INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION.; International Conference on Pattern Recognition; Hong Kong, China, 2006; Apr, 2006, 123-127 -- Piscataway; IEEE; 2006 Part: 1; (pages 123-127) -- 2006

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The Dipping Phenomenon

Loog, M.; Duin, R.P.W.

Journal on data semantics.; Structural, syntactic and statistical pattern recognition; Structural, SSPR & SPR; Tsukuba, Japan, 2012; Nov, 2012, 310-317 -- Heidelberg; Springer; c2012 Part 7626; (pages 310-317) -- 2012

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The Dipping Phenomenon

Loog, M.; Duin, R.P.W.

Journal on data semantics.; Simulation, modeling, and programming for autonomous robots; SIMPAR 2012; Tsukuba, Japan, 2012; Nov, 2012, 310-317 -- Heidelberg; Springer; c2012 Part 7628; (pages 310-317) -- 2012

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by this Author/Contributor:

  1. Duin, R.P.W.
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  4. Tax, D.M.J.
  5. Lee, W. J.

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