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Implementing fully automatic macro defect detection and classification system in high-production semiconductor fab [4689-89]

Lee, L. Pham, M. Pham, D. Khaja, M. Hennessey, K. A. Miller, J.; Herr, D. J. C.

Proceedings of SPIE, the International Society for Optical Engineering.; Metrology, inspection and process control for microlithography; Santa Clara, CA, 2002; Mar, 2002, 783-789 -- SPIE; 2002 (pages 783-789) -- 2002

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Investigation of JPEG 2000 encoder options on model observer performance in signal known exactly but variable tasks (SKEV) [5034-47]

Zhang, Y. Pham, B. Eckstein, M. P.; Krupinski, E. A.

Proceedings of SPIE, the International Society for Optical Engineering.; Image perception, observer performance and technology assessment; San Diego, CA, 2003; Feb, 2003, 371-382 -- SPIE; 2003 (pages 371-382) -- 2003

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Simulation of detection and beamforming with acoustical ground sensors [4743-07]

Wilson, D. K. Sadler, B. M. Pham, T.; Carapezza, E. M.

Proceedings of SPIE, the International Society for Optical Engineering.; Unattended ground sensor technologies and applications; Orlando, FL, 2002; Apr, 2001, 50-61 -- SPIE; 2002 (pages 50-61) -- 2001

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Effect of image compression for model and human observers in signal-known-statistically tasks [4686-02]

Eckstein, M. P. Pham, B. Abbey, C. K.; Krupinski, E. A.

Proceedings of SPIE, the International Society for Optical Engineering.; Image perception, observer performance and technology assessment; Medical imaging 2002; San Diego, CA, 2002; Feb, 2002, 13-24 -- SPIE; 2002 (pages 13-24) -- 2002

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5
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Feasibility of simultaneous correction of ametropia by varying gel refractive index with phaco-ersatz [4245-15]

Ho, A. Erickson, P. Manns, F. Pham, T. Parel, J.-M. A.; Ho, A.

Proceedings of SPIE, the International Society for Optical Engineering.; Ophthalmic technologies; San Jose, CA, 2001; Jan, 2001, 119-128 -- SPIE; 2001 (pages 119-128) -- 2001

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6
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Effect of annealing on mechanical and optical properties of in-situ doped SiC thin films [4601-42]

Pham, H. T. M. de Boer, C. R. Visser, C. C. C. G. Sarro, P. M.; Huang, Q.-A.

Proceedings of SPIE, the International Society for Optical Engineering.; Micromachining and microfabrication process technology and devices; Nanjing, China, 2001; Nov, 2001, 59-66 -- SPIE; 2001 (pages 59-66) -- 2001

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7
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Mechanical and structural properties of in-situ doped PECVD silicon carbide layer for post-processing surface micromachining [4557-32]

Pham, H. T. M. de Boer, C. R. Kwakernaak, K. Sloof, W. G. Sarro, P. M.; Yasaitis, J.

Proceedings of SPIE, the International Society for Optical Engineering.; Micromachining and microfabrication process technology; San Francisco, CA, 2001; Oct, 2001, 272-279 -- SPIE; 2001 (pages 272-279) -- 2001

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8
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Polarization-insensitive PECVD SiC waveguides for photonic sensing [5855-205]

Pandraud, G. et al.

Proceedings of SPIE, the International Society for Optical Engineering.; International conference optical fiber sensors; OFS-17; Bruges, Belgium, 2005; May, 2005, 836-839 -- SPIE; 2005 (pages 836-839) -- 2005

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9
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IC-compatible process for pattern transfer in deep wells for integration of RF components [4174-46]

Pham, N. P. Sarro, P. M. Burghartz, J. N.; Yasaitis, J.

Proceedings of SPIE, the International Society for Optical Engineering.; Micromachining and microfabrication process technology; Santa Clara, CA, 2000; Sep, 2000, 390-397 -- SPIE; 2000 (pages 390-397) -- 2000

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10
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Automatic classification of sulcal regions of the human brain cortex using pattern recognition (Honorable Mention Poster) [5032-167]

Behnke, K. J. Rettmann, M. E. Pham, D. L. Shen, D. Resnick, S. M.; Davatzikos, C. Prince, J. L.; Fitzpatrick, J. M.

Proceedings of SPIE, the International Society for Optical Engineering.; Image processing; medical imaging 2003; San Diego, CA, 2003; Feb, 2003, 1499-1510 -- SPIE; 2003 (pages 1499-1510) -- 2003

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  1. Pham, B.
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  3. Smith, M. J. T.
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  5. Sadjadi, F. A.

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