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On Refining Dissimilarity Matrices for an Improved NN Learning

Duin, R.P.W.; Pekalska, E.

INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION.; International conference on patttern recognition (ICPR 2008); Tampa, FL, 2008; Dec, 2008, 604-607 -- New York; IEEE Press Books; 2008 Part: 1; (pages 604-607) -- 2008

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  1. Duin, R.P.W.
  2. Pekalska, E.

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  1. Pattern recognition

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