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Surface Preparation Techniques for the Atomic Layer Deposition of Hafnium Oxide

Conard, T. et al.

Materials Research Society symposia proceedings.; Gate stack scaling: materials, role of interfaces and reliability implications; San Francisco, Calif., 2006; Apr, 2006, 143-148 -- Materials Research Society; 2006 Part: Part; (pages 143-148) -- 2006

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Hall-Petch Hardening in Pulsed Laser Deposited Nickel and Copper Thin Films

Knapp, J. A. Follsteadt, D. M. Banks, J. C. Myers, S. M.; Vinci, R.

Materials Research Society symposia proceedings.; Thin films: stresses and mechanical properties; Boston, MA, 1999; Nov, 2000, 69-74 -- Materials Research Society; 2000 (pages 69-74) -- 2000

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