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10 results  for Everything in this catalogue

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1
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Combination of PAPR reduction and linearization for the OFDM communication system

Ryu, H. G.

Wireless communications & mobile computing. VOL 11; NUMBER 1, ; 2011, 46-52 -- John Wiley & Sons, Ltd -- 2011

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2
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ICI problem and compensation in MIMO SC FDMA system with SC SFBC scheme

Zhang, X. P.; Ryu, H. G.

International journal of communication systems. VOL 23; NUMBER 12, ; 2010, 1521-1536 -- John Wiley & Sons, Ltd Part: Part 12; (pages 1521-1536) -- 2010

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3
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1.55-mum DFB lasers over a wide temperature range for analog application

Koo, B.-J. et al.

Microwave and optical technology letters. VOL 48; NUMB 2, ; 2006, 273-275 -- John Wiley & Sons, Ltd (pages 273-275) -- 2006

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4
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InGaN/GaN light emitting diode with R-plane polygonal facet deflectors

Kim, H. G. et al.

Physica status solidi. C, Conferences and critical reviews. VOL 5; NUMBER 6, ; 2008, 2367-2367 -- John Wiley & Sons, Ltd (pages 2367-2367) -- 2008

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5
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InGaN/GaN light emitting diode with R-plane polygonal facet deflectors

Kim, H. G. et al.

Physica status solidi. C, Conferences and critical reviews. VOL 5; NUMBER 6, ; 2008, 2267-2269 -- John Wiley & Sons, Ltd (pages 2267-2269) -- 2008

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6
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Characterization of plasma damage-free InGaN/GaN LED with periodic deflectors

Cuong, T. V. et al.

Physica status solidi. C, Conferences and critical reviews. VOL 5; NUMBER 6, ; 2008, 2155-2157 -- John Wiley & Sons, Ltd (pages 2155-2157) -- 2008

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7
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An FBAR- and LTCC-based RF front-end module for Wi-Fi and WiMAX dual-mode systems

Kim, D. et al.

Microwave and optical technology letters. VOL 52; NUMBER 3, ; 2010, 753-757 -- John Wiley & Sons, Ltd (pages 753-757) -- 2010

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8
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Microstructural Degradation of Ni-Rich Li[NixCoyMn1-x-y]O2 Cathodes During Accelerated Calendar Aging

Ryu, H. H. et al.

Small. VOL 14; NUMBER 45, ; 2018, n-a-n-a -- John Wiley & Sons, Ltd

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9
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Microstructural Degradation: Microstructural Degradation of Ni-Rich Li[NixCoyMn1-x-y]O2 Cathodes During Accelerated Calendar Aging (Small 45/2018)

Ryu, H. H. et al.

Small. VOL 14; NUMBER 45, ; 2018, n-a-n-a -- John Wiley & Sons, Ltd

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A Tight-Binding Study of Single-Atom Transistors

Ryu, H. et al.

Small. VOL 11; NUMBER 3, ; 2015, 374-381 -- John Wiley & Sons, Ltd Part 3; (pages 374-381) -- 2015

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by this Author/Contributor:

  1. Kim, H. Y.
  2. Kim, H.-K.
  3. Hong, C.-H.
  4. Cuong, T. V.
  5. Kim, H. G.

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