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Results 1 - 10 of 61  for Everything in this catalogue

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Full-scale field evaluation of wireless MEMS monitoring system [6932-47]

Kim, H. et al.

Proceedings of SPIE, the International Society for Optical Engineering. VOL 6932; PART 1, ; 2008, 6932 19 -- International Society for Optical Engineering; 1999 -- 2008

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Lens aberration measurement and analysis using a novel pattern [4346-135]

Nam, B. H. Cho, B. H. Park, J. O. Kim, D.-S. Baek, S. J. Jeong, J. H. Nam, B.-S. Hwang, Y. J. Song, Y. J.

International Society for Optical Engineering; 1999 Part: 2; (pages 1290-1299) -- 2001

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CD uniformity improvement by active scanner corrections [4691-29]

van Schoot, J. B. Noordman, O. Vanoppen, P. Blok, F. Yim, D. Park, C.-H. Cho, B.-H. Theeuwes, T. Min, Y.-H.; Yen, A.

International Society for Optical Engineering; 1999 Part: 1; (pages 304-314) -- 2002

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Electrical characterizations of smart hydrogel based on chitosan/poly(diallydimethylammonium chloride) in NaCl solutions [5385-53]

Yoon, S. G. et al.

Proceedings of SPIE, the International Society for Optical Engineering. VOL 5385, ; 2004, 500-507 -- International Society for Optical Engineering; 1999 (pages 500-507) -- 2004

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Comparison study between stepper (5x) and scanner (4x) for gate CD control using total process-proximity-based correction [4186-86]

Nam, B. H. Kim, D. S. Cho, B. H. Seok, N. K. Jeong, J. K. Kim, S. P. Kang, S. W. Hwang, Y. J. Song, Y. J.; Dao, G. T.

International Society for Optical Engineering; 1999 (pages 793-800) -- 2001

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Aberration sensitivity control for the isolation layer in low-k1 DRAM process [4691-84]

Cho, B.-H. Yim, D. Park, C.-H. Lee, S.-H. Yang, H.-J. Choi, J.-H.; Shin, Y.-C. Kim, C.-D. Choi, J.-S. Kang, K.-O.; Yen, A.

International Society for Optical Engineering; 1999 Part: 1; (pages 831-839) -- 2002

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7
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Aberration sensitivity control for the isolation layer in low-k1 DRAM process [4691-84]

Cho, B.-H. Yim, D. Park, C.-H. Lee, S.-H. Yang, H.-J. Choi, J.-H.; Shin, Y.-C. Kim, C.-D. Choi, J.-S. Kang, K.-O.; Yen, A.

International Society for Optical Engineering; 1999 Part: 2; (pages 831-839) -- 2002

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Black extraction method using gamut boundary descriptors [6058-24]

Cho, M.-K.; Kang, B.-H.; Choh, H.-K.

Proceedings of SPIE, the International Society for Optical Engineering. VOL 6058, ; 2006, 60580O -- International Society for Optical Engineering; 1999 -- 2006

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9
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Magnetic resonance current density image reconstruction in the spatial frequency domain [5030-63]

Lee, S. Y. Lee, S. C. Oh, S. H. Han, J. Y. Han, B. H. Cho, M. H.; Antonuk, L. E.

International Society for Optical Engineering; 1999 Part: 2; (pages 611-618) -- 2003

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10
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Neural-network-based parts classification for SMT processes (Invited Paper) [4564-33]

Kim, B. M. Cho, H. S.

International Society for Optical Engineering; 1999 (pages 268-279) -- 2001

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  1. Lee, B.-H.  (9)
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