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Results 1 - 10 of 21  for Everything in this catalogue

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Evaluation of inverse lithography technology for 55nm-node memory device [6924-117]

Cho, B. et al.

Proceedings of SPIE, the International Society for Optical Engineering. VOL 6924; PART 2, ; 2008, 6924 38 -- International Society for Optical Engineering; 1999 -- 2008

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Infrared imaging technology for detection of bruising damages of `Shingo' pear [8027-17]

Cho, B.-K. et al.

Proceedings of SPIE, the International Society for Optical Engineering. VOL 8027, ; 2011, 8027 0I -- International Society for Optical Engineering; 1999 -- 2011

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Visual discomfort under various brightness conditions using eye movements in watching stereoscopic 3D video [9011-72]

Cho, S.-H. et al.

Proceedings of SPIE, the International Society for Optical Engineering. VOL 9011, ; 2014, 9011 23 -- International Society for Optical Engineering; 1999 Part; -- 2014

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Optical properties and lattice images of phase-change optical disks laser-annealed at dynamic conditions [3109-47]

Hong, H.-C. et al.

SPIE INTERNATIONAL SOCIETY FOR OPTICAL Part: Part 3109; (pages 38-41) -- 1997

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5
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Optical performance enhancement technique for 45-nm node with binary mask [6607-53]

Jung, J.-S. et al.

Proceedings of SPIE, the International Society for Optical Engineering. VOL 6607; PART 1, ; 2007, 66071I -- International Society for Optical Engineering; 1999 -- 2007

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6
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Volumetric ultrasound image-forming using fully controllable 2-D CMUT-on-ASIC arrays [8675-13]

Kim, B.-H. et al.

Proceedings of SPIE, the International Society for Optical Engineering. VOL 8675, ; 2013, 8675 0A -- International Society for Optical Engineering; 1999 Part; -- 2013

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7
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Phase-rotation based receive-beamformer for miniaturized volumetric ultrasound imaging scanners using 2-D CMUT-on-ASIC arrays [8675-12]

Kim, B.-H. et al.

Proceedings of SPIE, the International Society for Optical Engineering. VOL 8675, ; 2013, 8675 0D -- International Society for Optical Engineering; 1999 Part; -- 2013

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New technology for enhancing depth of focus using birefringent material [3679-72]

Kim, D. H. et al.

SPIE INTERNATIONAL SOCIETY FOR OPTICAL Part: 2; (pages 704-714) -- 1999

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9
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Full-scale field evaluation of wireless MEMS monitoring system [6932-47]

Kim, H. et al.

Proceedings of SPIE, the International Society for Optical Engineering. VOL 6932; PART 1, ; 2008, 6932 19 -- International Society for Optical Engineering; 1999 -- 2008

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After development inspection (ADI) studies of photo resist defectivity of an advanced memory device [7520-18]

Kim, H.-S. et al.

Proceedings of SPIE, the International Society for Optical Engineering. VOL 7520, ; 2009, 7520 0J -- International Society for Optical Engineering; 1999 -- 2009

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Results 1 - 10 of 21  for Everything in this catalogue

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  1. Kim, Y  (4)
  2. Song, J.  (4)
  3. Bosch, J.G.  (4)
  4. Cho, K.  (4)
  5. Kim, B. H.  (4)
  6. Jeon, T.  (4)
  7. Doyley, M.M.  (4)
  8. Lee, S  (4)
  9. Lee, B. H.  (3)
  10. Cho, B. O.  (3)
  11. Chin, S. B.  (2)
  12. Choi, J.  (2)
  13. Kim, Y. H.  (2)
  14. Kim, H. S.  (2)
  15. Song, C. L.  (2)
  16. Allgair, J.A.  (1)
  17. Liao, B. H.  (1)
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