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Degradation dynamics, recovery, and characterization of negative bias temperature instability

Ershov, M. et al.

Microelectronics and reliability. VOL 45; NUMBER 1, ; 2005, 99-105 -- Elsevier Science B.V., Amsterdam. (pages 99-105) -- 2005

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  1. Clifton, P.
  2. Winters, S.
  3. Saxena, S
  4. Lindley, R.
  5. Minehane, S.

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