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The base current and related 1/f noise for SiGe HBTs realized by SEG/NSEG technology on SOI and bulk substrates

Lukyanchikova, N. et al.

Materials science in semiconductor processing.; Germanium based semiconductors from materials to devices; Nice, France, 2006; May, 2006, 727-731 -- Elsevier; 2006 (pages 727-731) -- 2006

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Low-temperature conductance measurements of surface states in HfO2-Si structures with different gate materials

Gomeniuk, Y. et al.

Materials science in semiconductor processing.; Symposium on characterization of high-k dielectric materials; Proceedings of E-MRS spring meeting symposium L; Nice, France, 2006; May, 2006, 980-984 -- Elsevier; 2006 Part: Part 6; (pages 980-984) -- 2006

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2 results  for Everything in this catalogue

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