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Time-resolved observation of Barkhausen avalanche in Co thin films using magneto-optical microscope magnetometer

Kim, D.-H. Choe, S.-B. Shin, S.-C.

Journal of applied physics. VOL 93; PART 10; NUMB 2, ; 2003, 6564-6566 -- AMERICAN INSTITUTE OF PHYSICS Part: 2; (pages 6564-6566) -- 2003

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Imprint failures and asymmetric electrical properties induced by thermal processes in epitaxial Bi~4Ti~3O~1~2 thin films

Park, B. H. et al.

Journal of applied physics. VOL 84; NUMBER 8, ; 1998, 4428-4435 -- AMERICAN INSTITUTE OF PHYSICS (pages 4428-4435) -- 1998

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Quantitative correlation between the local coercivity variation and magnetization reversal dynamics in Co/Pd multilayer thin films

Jang, H.-J. Choe, S.-B. Shin, S.-C.

Journal of applied physics. VOL 93; PART 12, ; 2003, 10143-10145 -- AMERICAN INSTITUTE OF PHYSICS (pages 10143-10145) -- 2003

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Hollow and solid spherical magnetostrictive particulate composites

Nersessian, N. et al.

Journal of applied physics. VOL 96; NUMB 6, ; 2004, 3362-3365 -- AMERICAN INSTITUTE OF PHYSICS (pages 3362-3365) -- 2004

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Properties of electron traps in In~1~-~xGa~xAs~yP~1~-~y grown on GaAs~0~.~6~1P~0~.~3~9

Ho Ki Kwon; Choe, B.-D.; Lim, H.

Journal of applied physics. VOL 82; NUMBER 6, ; 1997, 2969-2973 -- AMERICAN INSTITUTE OF PHYSICS Part: Part 6; (pages 2969-2973) -- 1997

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Effect of wet oxidized Al~xGa~1~-~xAs layer on the interdiffusion of InGaAs/GaAs quantum wells

Choe, J.-S. et al.

Journal of applied physics. VOL 83; NUMBER 11; NUMBER 1, ; 1998, 5779-5782 -- AMERICAN INSTITUTE OF PHYSICS Part: Part 11; (pages 5779-5782) -- 1998

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Matrix method for the x-ray rocking curve simulation

Kim, I. et al.

Journal of applied physics. VOL 83; NUMBER 7, ; 1998, 3932-3934 -- AMERICAN INSTITUTE OF PHYSICS (pages 3932-3934) -- 1998

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Effects of donor doping on deep traps in In~0~.~5Ga~0~.~5P grown by liquid phase epitaxy

Ho Ki Kwon et al.

Journal of applied physics. VOL 78; NUMBER 12, ; 1995, 7395-7397 -- AMERICAN INSTITUTE OF PHYSICS Part: Part 12; (pages 7395-7397) -- 1995

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Study of charge trapping instabilities in a silicon-nitride/indium-phosphide metal-insulator-semiconductor structure by the constant-capacitance method

Kim, C. H. et al.

Journal of applied physics. VOL 72; NUMBER 10, ; 1992, 4743 -- AMERICAN INSTITUTE OF PHYSICS Part: Part 10; -- 1992

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Investigation of electrical properties and stability of Schottky contacts on (NH~4)~2S~x-treated n- and p-type In~0~.~5Ga~0~.~5P

Kwon, S. D. et al.

Journal of applied physics. VOL 78; NUMBER 4, ; 1995, 2482 -- AMERICAN INSTITUTE OF PHYSICS Part: Part 4; -- 1995

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by this Author/Contributor:

  1. Choe, B. D.
  2. Lim, H.
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  4. Ho Ki Kwon
  5. Moon, C. R.

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  1. Physics

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