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Resource-Efficient SRAM-Based Ternary Content Addressable Memory

Ahmed, A.; Park, K.; Baeg, S.

IEEE transactions on very large scale integration (VLSI) systems. VOL 25; NUMBER 4, ; 2017, 1583-1587 -- INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS

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Asymmetric Body Bias Control With Low-Power FD-SOI Technologies: Modeling and Power Optimization

Okuhara, H. et al.

IEEE transactions on very large scale integration (VLSI) systems. VOL 26; NUMBER 7, ; 2018, 1254-1267 -- INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS

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A Comprehensive Reliability Assessment of Fault-Resilient Network-on-Chip Using Analytical Model

Dang, K. N. et al.

IEEE transactions on very large scale integration (VLSI) systems. VOL 25; NUMBER 11, ; 2017, 3099-3112 -- INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS

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Analysis and On-Chip Monitoring of Gate Oxide Breakdown in SRAM Cells

Ahmed, F.; Milor, L.

IEEE transactions on very large scale integration (VLSI) systems. VOL 20; NUMBER 5, ; 2012, 855-864 -- INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS Part: Part 5; (pages 855-864) -- 2012

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Online Measurement of Degradation Due to Bias Temperature Instability in SRAMs

Ahmed, F.; Milor, L.

IEEE transactions on very large scale integration (VLSI) systems. VOL 24; NUMBER 6, ; 2016, 2184-2194 -- INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS (pages 2184-2194) -- 2016

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The Effect of LUT and Cluster Size on Deep-Submicron FPGA Performance and Density

Ahmed, E.; Rose, J.

IEEE transactions on very large scale integration (VLSI) systems. VOL 12; PART 3, ; 2004, 288-298 -- INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS (pages 288-298) -- 2004

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Efficient Low-Power Digital Baseband Transceiver for IEEE 802.15.6 Narrowband Physical Layer

Shalaby, Ahmed; Sayed, Mohammed S.

IEEE transactions on very large scale integration (VLSI) systems. Volume 26:Number 11 (2018, October 22nd); pp 2372-2385 -- Institute of Electrical and Electronics Engineers

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Three-Dimensional Pipeline ADC Utilizing TSV/ Design Optimization and Memristor Ratioed Logic

Mirzaie, Nahid; Alzahmi, Ahmed; Shamsi, Hossein

IEEE transactions on very large scale integration (VLSI) systems. Volume 26:Number 12 (2018, November 30th); pp 2619-2627 -- Institute of Electrical and Electronics Engineers

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Performance and Cost Tradeoffs in Metal-Programmable Structured ASICs (MPSAs)

Ahmed, U.; Lemieux, G. G.; Wilton, S. J.

IEEE transactions on very large scale integration (VLSI) systems. VOL 19; NUMBER 12, ; 2011, 2195-2208 -- INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS Part: Part 12; (pages 2195-2208) -- 2011

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Overloaded CDMA Crossbar for Network-On-Chip

Ahmed, K. E.; Rizk, M. R.; Farag, M. M.

IEEE transactions on very large scale integration (VLSI) systems. VOL 25; NUMBER 6, ; 2017, 1842-1855 -- INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS

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