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Conference Proceeding
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Study of the stability of 3C-SiC single crystals using high-resolution diffuse X-ray scattering

AIP Conference Proceedings, 2010, Vol.1292, pp.71-74 [Peer Reviewed Journal]

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Defects and Polytypism in SiC: The Role of Diffuse X-Ray Scattering

AIP Conference Proceedings, Vol.1292, pp.43-46 [Peer Reviewed Journal]

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by this Author/Contributor:

  1. Dompoint, D
  2. Chaussende, D
  3. Dompoint, Deborah
  4. Boulle, Alexandre
  5. Boulle, A

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