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Electronic properties of single Ge/Si quantum dot grown by ion beam sputtering deposition

Nanotechnology, March 13, 2015, Vol.26(10), pp.1-9 [Peer Reviewed Journal]

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by this Author/Contributor:

  1. Yang, Y.
  2. Ke, S.Y.
  3. Qiu, F
  4. Yang, J.
  5. Hu, W

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