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6 results for Explore Further
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author:
Chen PI-Jin
subject:
Measurement OR Analysis Of Nanostructures
author:
Guo Cai-Lin
author:
Tang Jie
subject:
Measurement OR Analysis Of Nanostructures
author:
Guo Cai-Lin
author:
Tang Jie
| Result Number | Material Type | Add to My Shelf Action | Record Details and Options |
|---|---|---|---|
| 1 |
Material Type: Patent
|
|
Process for manufacturing a reference leakFull text available |
| 2 |
Material Type: Patent
|
|
Field emitting light source and method for making the sameFull text available |
| 3 |
Material Type: Patent
|
|
Field emission cathode and planar light source using the sameFull text available |
| 4 |
Material Type: Patent
|
|
Field emitting light source and method for making the sameFull text available |
| 5 |
Material Type: Patent
|
|
Field emission cathode and planar light source using the sameFull text available |
| 6 |
Material Type: Patent
|
|
Process for manufacturing a reference leakFull text available |
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