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Analysis of the Reliability of the Protected Memories Affected by Soft Errors

Liu, X.-h. et al.

Lecture notes in electrical engineering. VOL 244, ; 2013, 243-256 -- Springer Science + Business Media Part; (pages 243-256) -- 2013

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by this Author/Contributor:

  1. Wu, H.
  2. Jiao, W.
  3. Liu, X. H.
  4. Shi, C.
  5. Mou, W.-h.

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