skip to main content
Show Results with:

3 results  for Everything in this catalogue

Refined by: publisher: Elsevier remove author: Joo, M. S. remove
Result Number Material Type Add to My Shelf Action Record Details and Options
1
Material Type:
Article
Add to My workspace

Channel mobility degradation and charge trapping in high-k/metal gate NMOSFETs

Mathew, S. et al.

Thin solid films.; International conference on materials for advanced technologies; ICMAT 2003; Singapore, 2003; Dec, 2004, 11-14 -- Elsevier,; 2004 (pages 11-14) -- 2004

Check library holdings

2
Material Type:
Article
Add to My workspace

Wet etching characteristics and surface morphology evaluation of MOCVD grown HfO~2 film

Balasubramanian, M. et al.

Thin solid films.; International conference on materials for advanced technologies; ICMAT 2003; Singapore, 2003; Dec, 2004, 101-105 -- Elsevier,; 2004 (pages 101-105) -- 2004

Check library holdings

3
Material Type:
Article
Add to My workspace

Effect of annealing on the composition and structure of HfO~2 and nitrogen-incorporated HfO~2

Yeo, C. C. et al.

Thin solid films.; International conference on materials for advanced technologies; ICMAT 2003; Singapore, 2003; Dec, 2004, 90-95 -- Elsevier,; 2004 (pages 90-95) -- 2004

Check library holdings

3 results  for Everything in this catalogue

Refine Search Results

Refine my results

Author/Contributor 

  1. Bera, L. K.  (2)
  2. Mathew, S  (2)
  3. Yeo, C. C.  (1)
  4. Lim, V.  (1)
  5. Whang, S. J.  (1)
  6. Balasubramanian, M  (1)
  7. Refine further open sub menu

Try a new search

Ignore my search and look for everything

by this Author/Contributor:

  1. Mhaisalkar, S. G.
  2. Joo, M. S.
  3. Cho, B. J.
  4. Zhang, D.-H.
  5. Balasubramanian, N.

Searching Remote Databases, Please Wait