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Study of the stability of 3C-SiC single crystals using high-resolution diffuse X-ray scattering

AIP Conference Proceedings, 2010, Vol.1292, pp.71-74 [Peer Reviewed Journal]

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by this Author/Contributor:

  1. Dompoint, D
  2. Chaussende, D
  3. Galben-Sandulache, I.G.
  4. Galben-Sandulache, I
  5. Boulle, A

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