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Micropropulsion for small spacecraft: a new challenge for field effect electric propulsion and microstructured liquid metal ion sources

Mitterauer, J. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 380-386 -- John Wiley,; 2004 (pages 380-386) -- 2004

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Comments and references relating to early work in field electron emission

Kleint, C. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 387-390 -- John Wiley,; 2004 (pages 387-390) -- 2004

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Field emission current fluctuations from isolated carbon nanotubes

Tuggle, D. W. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 489-492 -- John Wiley,; 2004 (pages 489-492) -- 2004

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Numerical analysis of the liquid metal flow in the presence of an electric field: application to liquid metal ion source

Suvorov, V. G. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 421-425 -- John Wiley,; 2004 (pages 421-425) -- 2004

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Influence of electron irradiation on the microstructure of ferritic model alloys

Radiguet, B. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 515-521 -- John Wiley,; 2004 (pages 515-521) -- 2004

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Conventional and tomographic atom probe investigations of secondary-hardening carbides

Lettner, H. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 540-545 -- John Wiley,; 2004 (pages 540-545) -- 2004

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Preciptation of niobium carbides in Fe-C-Nb steel

Bemont, E. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 585-588 -- John Wiley,; 2004 (pages 585-588) -- 2004

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Improvement of multilayer analyses with a three-dimensional atom probe

Vurpillot, F. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 552-558 -- John Wiley,; 2004 (pages 552-558) -- 2004

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Time-of-flight atom-probe field ion microscope studies of surface-related phenomena

Tsong, T. T. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 365-371 -- John Wiley,; 2004 (pages 365-371) -- 2004

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Brightness of electron beam emitted from a single pentagon on a multiwall carbon nanotube tip

Hata, K. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 506-509 -- John Wiley,; 2004 (pages 506-509) -- 2004

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  1. Danoix, F.
  2. Watts, J. F.
  3. Forbes, R. G.
  4. Deng, S. Z.
  5. Chen, J

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