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Field emission study of titanium silicide array

Choi, S. S. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 435-438 -- John Wiley,; 2004 (pages 435-438) -- 2004

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Field emission from thick carbon nanotube film on Si substrate

Wang, Q.; Zhu, C.-C.; Shi, Y.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films. VOL 36; NUMB 5/6, ; 2004, 478-480 -- JOHN WILEY & SONS LTD (pages 478-480) -- 2004

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Experimental evidence of resonant field emission from ultra-thin amorphous diamond thin films

She, J. C. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films. VOL 36; NUMB 5/6, ; 2004, 461-464 -- JOHN WILEY & SONS LTD (pages 461-464) -- 2004

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Acid treatment of carbon nanofibers with encapsulated catalytic iron nanoparticles

Wu, P. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films. VOL 36; NUMB 5/6, ; 2004, 497-500 -- JOHN WILEY & SONS LTD (pages 497-500) -- 2004

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Conventional and tomographic atom probe investigations of secondary-hardening carbides

Leitner, H. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films. VOL 36; NUMB 5/6, ; 2004, 540-545 -- JOHN WILEY & SONS LTD (pages 540-545) -- 2004

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Oxidation improvement of field electron emission from diamond nanomaterials

Karabutov, A. V. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 455-460 -- John Wiley,; 2004 (pages 455-460) -- 2004

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Nanostructural evolution of Al~3Sc precipitates in an Al-Sc-Mg alloy by three-dimensional atom probe microscopy

Marquis, E. A.; Seidman, D. N.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films. VOL 36; NUMB 5/6, ; 2004, 559-563 -- JOHN WILEY & SONS LTD (pages 559-563) -- 2004

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Dependence of the interfacial excess on the threshold value of the isoconcentration surface

Yoon, K. E. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films. VOL 36; NUMB 5/6, ; 2004, 594-597 -- JOHN WILEY & SONS LTD (pages 594-597) -- 2004

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Numerical analysis of the liquid metal flow in the presence of an electric field: application to liquid metal ion source

Suvorov, V. G.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films. VOL 36; NUMB 5/6, ; 2004, 421-425 -- JOHN WILEY & SONS LTD (pages 421-425) -- 2004

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Field emission current fluctuations from isolated carbon nanotubes

Tuggle, D. W. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 489-492 -- John Wiley,; 2004 (pages 489-492) -- 2004

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Results 1 - 10 of 96  for Everything in this catalogue

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