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Changes in chemical behavior of thin film lead zirconate titanate during Ar+-ion bombardment using XPS

Kim, J. N. Shin, K. S. Kim, D. H. Park, B. O. Kim, N. K. Cho, S. H.

Applied surface science. VOL 206; NUMBER 1-4, ; 2003, 119-128 -- Elsevier Science B.V., Amsterdam. (pages 119-128) -- 2003

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