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Simultaneous fast scanning XRF, dark field, phase-, and absorption contrast tomography [8851-24]

Medjoubi, K. et al.

Proceedings of SPIE, the International Society for Optical Engineering.; X-ray nanoimaging: instruments and methods; San Diego, CA, 2013; Aug, 2013, 8851 0P -- Bellingham, Washington; SPIE; [2013] Part; -- 2013

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