skip to main content
Show Results with:

Learning Curves for the Analysis of Multiple Instance Classifiers

Tax, D.M.J.; Duin, R.P.W.

Journal on data semantics.; International workshop on structural and syntactic pattern recognition; Structural, syntactic, and statistical pattern recognition: joint IAPR international workshop, SSPR & SPR 2008; Orlando, FL, 2008; Dec, 2008, 724-733 -- Berlin; Springer; c2008 (pages 724-733) -- 2008

Check library holdings

Searching Remote Databases, Please Wait