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Full-field x-ray nano-imaging at SSRF [8851-49]

Deng, B. et al.

Proceedings of SPIE, the International Society for Optical Engineering.; X-ray nanoimaging: instruments and methods; San Diego, CA, 2013; Aug, 2013, 8851 1D -- Bellingham, Washington; SPIE; [2013] Part; -- 2013

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