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The noise measurement and analysis system of optoelectronic coupled devices based on virtual instrument [7156-99]

Li, Y.; Zhou, Q.

Proceedings of SPIE, the International Society for Optical Engineering.; Optical systems and optoelectronic instruments; Beijing, China, 2008; Nov, 7156, 7156 29 -- Bellingham, Wash.; SPIE; c2009 -- 7156

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