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Three-dimensional whole circumference shape measurement system using optical patterns projection technique [7156-177]

Tsujioka, K. et al.

Proceedings of SPIE, the International Society for Optical Engineering.; Optical systems and optoelectronic instruments; Beijing, China, 2008; Nov, 7156, 7156 0C -- Bellingham, Wash.; SPIE; c2009 -- 7156

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