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An apparatus for the measurement of spectral specular reflectance of spot area in curved surfaces (Invited Paper) [7156-127]

Zheng, X.; Wang, Z.; Zhao, Y.

Proceedings of SPIE, the International Society for Optical Engineering.; Optical systems and optoelectronic instruments; Beijing, China, 2008; Nov, 7156, 7156 0B -- Bellingham, Wash.; SPIE; c2009 -- 7156

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