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Use of energy-space diagrams in free-electron models of field electron emission

Forbes, R. G. et al.

Surface and interface analysis : an international journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films.; International field emission symposium; Lyon, France, 2002; Jul, 2004, 395-401 -- John Wiley,; 2004 (pages 395-401) -- 2004

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