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Microcircuit Device Reliability. Digital SSI/MSI Data

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  • Title:
    Microcircuit Device Reliability. Digital SSI/MSI Data
  • Author: Ballou, T A
  • Contributor: Reliability Analysis Center Griffiss Afb Ny (Corporate Author)
  • Subjects: Electrical and Electronic Equipment ; Microcircuits ; Failure
  • Language: English
  • Description: This book contains data on small-scale and medium-scale (SSI/MSI) digital microcircuit device failure rates. The raw data is presented as well as a series of summaries designed to bring out the salient points. Where possible, graphical aids are used to depict the data. Comparisons of predicted to observed field failure rates are given, predictions being carried out to MIL-HDBK-217D. This book includes the new wholly automated format not included in previous editions.

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