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High frequency measures of OHC nonlinear capacitance (NLC) and their significance: Why measures stray away from predictions

Santos-Sacchi, Joseph; Bergevin, Christopher; Puria, Sunil

AIP conference proceedings. Volume 1965 (2018) -- American Institute of Physics

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  • Title:
    High frequency measures of OHC nonlinear capacitance (NLC) and their significance: Why measures stray away from predictions
  • Author: Santos-Sacchi, Joseph;
    Bergevin, Christopher;
    Puria, Sunil
  • Found In: AIP conference proceedings. Volume 1965 (2018)
  • Journal Title: AIP conference proceedings
  • Rights: Licensed
  • Publication Details: American Institute of Physics
  • Identifier: System Number: ETOCvdc_100091035310.0x000001; Journal ISSN: 0094-243X; 10.1063/1.5038477
  • Publication Date: 2018
  • Physical Description: Electronic
  • Shelfmark(s): 0773.430000
  • UIN: ETOCvdc_100091035310.0x000001

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