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Sub- $\mu$ Vrms-Noise Sub- $\mu$ W/Channel ADC-Direct Neural Recording With 200-mV/ms Transient Recovery Through Predictive Digital Autoranging

Kim, C. et al.

IEEE journal of solid-state circuits. VOL 53; NUMBER 11, ; 2018, 3101-3110 -- IEEE; 1998

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  • Title:
    Sub- $\mu$ Vrms-Noise Sub- $\mu$ W/Channel ADC-Direct Neural Recording With 200-mV/ms Transient Recovery Through Predictive Digital Autoranging
  • Author: Kim, C.;
    Joshi, S.;
    Courellis, H.;
    Wang, J.;
    Miller, C.;
    Cauwenberghs, G.
  • Found In: IEEE journal of solid-state circuits. VOL 53; NUMBER 11, ; 2018, 3101-3110
  • Journal Title: IEEE journal of solid-state circuits.
  • Subjects: Dewey: 621 621.3
  • Publication Details: IEEE; 1998
  • Language: English
  • Identifier: System Number: ETOCRN391430353; Journal ISSN: 0018-9200
  • Publication Date: 2018
  • Physical Description: Electronic
  • Accrual Information: Monthly
  • Shelfmark(s): 4362.985500
  • UIN: ETOCRN391430353

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