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Characterization of grain alignment in Si3N4(w)/Si3N4 composites

Zou, L. et al.

Materials letters. VOL 58; NUMBER 10, ; 2004, 1587-1592 -- Elsevier Science B.V., Amsterdam. (pages 1587-1592) -- 2004

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  • Title:
    Characterization of grain alignment in Si3N4(w)/Si3N4 composites
  • Author: Zou, L.;
    Park, D. S.;
    Cho, B. U.;
    Huang, Y.;
    Kim, H. D.
  • Found In: Materials letters. VOL 58; NUMBER 10, ; 2004, 1587-1592
  • Journal Title: Materials letters.
  • Subjects: Electrical and Electronic Engineering; Mechanical Engineering; Civil Engineering; Physics; LCC: TA418; Dewey: 620.1105 530
  • Publication Details: Elsevier Science B.V., Amsterdam.
  • Language: English
  • Abstract: Three kinds of b-Si3N4 whisker-reinforced Si3N4 composites with different whisker alignment were designed and fabricated by using tape casting, extrusion and hot pressing processes. The grain alignment of the composites was characterized quantitatively by normalized pole density based on X-ray diffraction (XRD) measurement. The normalized pole density Whklt near the normal of the surface perpendicular to the whisker alignment direction was used to characterize the degree of the grain alignment. The distribution of normalized pole density of the (002) lattice plane in different directions was also obtained. The grain alignment was further approved by scanning electron microscopy analysis.
  • Identifier: Journal ISSN: 0167-577X
  • Publication Date: 2004
  • Physical Description: Electronic
  • Accrual Information: Monthly
  • Shelfmark(s): 5396.002000
  • UIN: ETOCRN145057655

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