skip to main content
Show Results with:

Uniformity compensation for high quantum efficiency focal plane arrays [3061-59]

Horman, S. R. et al.

SPIE INTERNATIONAL SOCIETY FOR OPTICAL Part: Part 3061; (pages 484-495) -- 1997

Check library holdings

  • Title:
    Uniformity compensation for high quantum efficiency focal plane arrays [3061-59]
  • Author: Horman, S. R.;
    Zurasky, M. W.;
    Talamonti, J. J.;
    Hepfer, K. C.;
    Andresen, B. F.;
    Strojnik, M.
  • Found In: Proceedings of SPIE, the International Society for Optical Engineering. ISSUE 3061; NUMBER 2, ; 1997, 484-495
  • Journal Title: Proceedings of SPIE, the International Society for Optical Engineering.
  • Subjects: Electrical and Electronic Engineering; Mechanical Engineering; Civil Engineering; Dewey: 621.36
  • Publication Details: SPIE INTERNATIONAL SOCIETY FOR OPTICAL
  • Language: English
  • Abstract: NSWCDD has developed a new nonuniformity correction (NUC) technique that has been demonstrated to significantly reduce both fixed pattern and temporal noise in sensors using high quantum efficiency (QE) infrared (IR) staring focal plane arrays (FPA). Sensors using this technique have been shown to have good response in every pixel, i.e., there are no dead or anomalously noisy pixels anywhere in the field of view (FOV). This technique will also enable development of sensors with very small apertures as well as those which can dynamically trade off sensitivity, resolution and frame rate. In addition, effective yield of detector production will be enhanced, since these benefits can be obtained using arrays that would be rejected for most applications, were conventional NUC used. This technique has been demonstrated to work as specified through analysis of real time data. A high performance, concept demonstration sensor, is in the final stages of acceptance testing, with delivery planned for April 1997.
  • Identifier: Journal ISSN: 0361-0748
  • Publication Date: 1997
  • Physical Description: Physical
  • Shelfmark(s): 6823.100000
  • UIN: ETOCRN033490264

Searching Remote Databases, Please Wait