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Deep Level Characterization of 5 MeV Proton Irradiated SiC PiN Diodes

Alfieri, G. et al.

Materials science forum -- Trans Tech Publications -- Volume: 858 (pages 308-311) -- 2016

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  • Title:
    Deep Level Characterization of 5 MeV Proton Irradiated SiC PiN Diodes
  • Author: Alfieri, G.;
    Mihaila, A.;
    Ayedh, H. M.;
    Svensson, B. G.;
    Hazdra, P.;
    Godignon, P.;
    Millan, J.;
    Kicin, S.
  • Found In: Materials science forum. Volume 858(2016); 2016; 308-311
  • Journal Title: Materials science forum
  • Subjects: Materials; Materials; Materials; LCSH: Materials; LCSH: Materials; Dewey: 620.1105
  • Rights: ETOC material - rights may apply
  • Publication Details: Trans Tech Publications
  • Place Name: Silicone carbide and related materials (International conference)
  • Description: Silicone carbide and related materials (International conference):Giardini Naxos, Italy. Oct 2015
  • Identifier: ETOCCN601536801
    Journal ISSN: 0255-5476
  • Publication Date: 2016
  • Physical Description: Physical
  • Shelfmark(s): 5396.435700
    (P) TA 77 -E(13)
  • UIN: ETOCCN601536801

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