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Current Margin Against the Fault Current in REBCO Coated Conductors

Ishiyama, A.|Momotari, H.|Wang, X.|Arai, M.|Ueda, H.|Ohya, M.|Ohmatsu, K.|Fujiwara, N.

Institute of Electrical and Electronics Engineers; 2011 -- Volume: 21 Part: 1/3; (pages 3033-3036) -- 2011

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