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Studies of the Dynamics of Thin Ion Exchange Films by Spectroscopic Ellipsometry and Attenuated Total Reflectance Spectroscopy

Pantelic, N. et al.

MATERIALS RESEARCH FORUM; Yugoslav Materials Research Society:; Recent developments in advanced materials and processes; Herceg Novi, Serbia and Montenegro, 2005; Sep, 2006, 431-438 -- Zurich; [Great Britain]:; Trans Tech Publications Ltd,; c2006 (pages 431-438) -- 2006

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  • Title:
    Studies of the Dynamics of Thin Ion Exchange Films by Spectroscopic Ellipsometry and Attenuated Total Reflectance Spectroscopy
  • Author: Pantelic, N.;
    Piruska, A.;
    Seliskar, C. J.;
    Uskokovic, D. P.;
    Milonjic, S. K.;
    Rakovic, D. I.
  • Found In: MATERIALS RESEARCH FORUM; Yugoslav Materials Research Society:; Recent developments in advanced materials and processes; Herceg Novi, Serbia and Montenegro, 2005; Sep, 2006, 431-438
  • Conference Title: MATERIALS RESEARCH FORUM
  • Subjects: Materials; Materials; YUCOMAT; Yu-MRS
  • Publication Details: Zurich; [Great Britain]:; Trans Tech Publications Ltd,; c2006
  • Language: English
  • Place Name: Herceg Novi, Serbia and Montenegro
  • Identifier: Journal ISSN: 0255-5476
    Conference ISBN: 0878494057 (pbk.)
  • Publication Date: 2006
  • Physical Description: Physical
  • Shelfmark(s): 5369.435700
  • UIN: ETOCCN060253467

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