skip to main content
Show Results with: Show Results with:

Sensitivity and S/N-Ratio of Superconducting High-Resolution X-Ray Spectrometers

Drury, O. B.; Friedrich, S.

IEEE transactions on applied superconductivity.; The 2004 applied superconductivity conference; Jacksonville, FL, 2004; Oct, 2005, 613-617 -- IEEE; 2005 Part: 1; (pages 613-617) -- 2005

Check library holdings

  • Title:
    Sensitivity and S/N-Ratio of Superconducting High-Resolution X-Ray Spectrometers
  • Author: Drury, O. B.;
    Friedrich, S.
  • Found In: IEEE transactions on applied superconductivity.; The 2004 applied superconductivity conference; Jacksonville, FL, 2004; Oct, 2005, 613-617
  • Conference Title: IEEE transactions on applied superconductivity.
  • Subjects: Applied superconductivity
  • Publication Details: IEEE; 2005
  • Language: English
  • Place Name: Jacksonville, FL
  • Description: Part 1 of 3
  • Identifier: Journal ISSN: 1051-8223
  • Publication Date: 2005
  • Physical Description: Physical
  • Shelfmark(s): 4363.131000
  • UIN: ETOCCN056190970

Searching Remote Databases, Please Wait